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ID: 112636.0, MPI für Kolloid- und Grenzflächenforschung / Grenzflächen
X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface
Authors:Kubowicz, S.; Thünemann, A. F.; Geue, T. M.; Pietsch, U.; Watson, M. D.; Tchebotareva, N.; Müllen, K.
Date of Publication (YYYY-MM-DD):2003-12-23
Title of Journal:Langmuir
Volume:19
Issue / Number:26
Start Page:10997
End Page:10999
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Affiliations:MPI für Kolloid- und Grenzflächenforschung/Grenzflächen
Identifiers:ISI:000187507500052 [ID No:1]
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