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ID: 241934.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Combined EELS, EDX, and STEM investigations of Cu-induced nanostrucutures and thin surface layer phases
Authors:Hollensteiner, S; Sigle, W.; Spiecker, E.; Jäger, W.
Language:English
Date of Publication (YYYY-MM-DD):2005
Title of Journal:Zeitschrift für Metallkunde
Journal Abbrev.:Z. Metallk.
Volume:96
Start Page:888
End Page:893
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Ehemalige Abt. Rühle
External Affiliations:Technische Fakultät, Christian-Albrechts-Universität zu Kiel, Kiel, Germany
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