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ID: 251034.0, MPI für Eisenforschung GmbH / Interface Chemistry and Surface Engineering
Temperature stability of thin anodic oxide films in metal/insulator/metal structures: A comparison between tantalum and aluminium oxide
Authors:Jeliazova, Y.; Kayser, M.; Mildner, B.; Hassel, A. W.; Diesing, D.
Date of Publication (YYYY-MM-DD):2006
Title of Journal:Thin Solid Films
Volume:500
Start Page:330
End Page:335
Review Status:not specified
Audience:Popular
External Publication Status:published
Document Type:Article
Affiliations:MPI für Eisenforschung GmbH
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