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ID: 446606.0, MPI für Eisenforschung GmbH / Interface Chemistry and Surface Engineering
Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM)
Authors:Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
Language:English
Name of Conference/Meeting:11th International Fischer Symposium on Microscopy in Electrochemistry
Place of Conference/Meeting:Benediktbeuern, Germany
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2009-07
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2009-07
Document Type:Talk at Event
Affiliations:MPI für Eisenforschung GmbH
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