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ID: 458891.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers
Authors:Łaszcz, A.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Phillipp, F.; van Aken, P. A.; Katcki, J.
Language:English
Date of Publication (YYYY-MM-DD):2010
Title of Journal:Journal of Microscopy
Volume (in Journal):237
Issue / Number:3
Start Page:347
End Page:351
Name of Conference/Meeting:EM 2008 - XIII International Conference on Electron Microscopy
Place of Conference/Meeting:Zakopane, Poland
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2008-06-08
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2008-06-11
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Institute of Electron Technology, Al. Lotnikow 32/46, 02–668 Warsaw, Poland.
Identifiers:DOI:10.1111/j.1365-2818.2009.03258.x
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