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ID: 498835.0, MPI für Eisenforschung GmbH / Interface Chemistry and Surface Engineering
Surface-sensitive reflection-mode EXAFS from layered sample systems: The influence of surface and interface roughness
Authors:Keil, P.; Lützenkirchen-Hecht, D.
Language:English
Date of Publication (YYYY-MM-DD):2009
Title of Journal:J. Synchrotron Rad.
Volume:16
Start Page:443
End Page:443
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Affiliations:MPI für Eisenforschung GmbH
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