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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



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ID: 11075.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
The SESAM Project - Present State and Applications
Authors:Sigle, W.; Krämer, S.; Zern, A.; Cai, Y.; Eigenthaler, U.; Hahn, K.; Rühle, M.
Language:English
Publisher:Microscopy Society of Southern Africa
Place of Publication:Onderstepoort
Date of Publication (YYYY-MM-DD):2002
Title of Proceedings:Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1
Start Page:329
End Page:330
Name of Conference/Meeting:ICEM 15. 15th International Congress on Electron Microscopy
Place of Conference/Meeting:Durban [South Africa]
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2002-09-01
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2002-09-06
Review Status:not specified
Audience:Experts Only
Free Keywords:67-ru_2002;
External Publication Status:published
Document Type:Conference-Paper
Affiliations:MPI für Metallforschung/Abt. Rühle
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