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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 112681.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Fast and reliable evaluation of lattice distortions from convergent-beam electron diffraction patterns
Authors:Lu, Z.; Pyczak, F.; Krämer, S.; Biermann, H.; Mughrabi, H.
Language:English
Date of Publication (YYYY-MM-DD):2003-07-11
Title of Journal:Philosophical Magazine
Journal Abbrev.:Philos. Mag.
Volume:83
Issue / Number:20
Start Page:2383
End Page:2397
Review Status:not specified
Audience:Experts Only
Comment of the Author/Creator:Date: 2003, JUL 11
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Abt. Rühle
External Affiliations:Univ Erlangen Nurnberg, Inst Werkstoffwissensch, Lehrstuhl 1, D-91058 Erlangen, Germany.
Identifiers:ISI:000184129100005 [ID No:1]
ISSN:1478-6443 [ID No:2]
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