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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)     Display Documents



  history
ID: 174100.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)
Structure, morphology, and optical properties of thin film of F16CuPc grown on silicondioxide
Authors:Ossó, J. O.; Schreiber, F.; Alonso, M. I.; Barrena, E.; Dosch, H.
Language:English
Date of Publication (YYYY-MM-DD):2004-03
Title of Journal:Organic Electronics
Volume:5
Issue / Number:1 - 3
Start Page:135
End Page:140
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Peter Wochner
Affiliations:MPI für Metallforschung/Abt. Dosch
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