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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2000     Display Documents



  history
ID: 181880.0, MPI für Festkörperforschung / FKF Publikationen 2000
Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy
Authors:Stangl, J.; Roch, T.; Bauer, G.; Kegel, I.; Metzger, T. H.; Schmidt, O. G.; Eberl, K.; Kienzle, O.; Ernst, F.
Date of Publication (YYYY-MM-DD):2000
Title of Journal:Applied Physics Letters
Volume:77
Start Page:3953
End Page:3955
Copyright:Jahrbuch 2001, Copyright MPG 2001
Review Status:not specified
Audience:Not Specified
Intended Educational Use:No
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
Identifiers:LOCALID:27483
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