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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2004     Display Documents



  history
ID: 192706.0, MPI für Festkörperforschung / FKF Publikationen 2004
SrBi2Nb2O9 thin films epitaxially grown on Pt epitaxial bottom layers: structural characteristics and nanoscale characterization of the ferroelectric behaviour by AFM
Authors:Duclère, J. R.; Guilloux-Viry, M.; Bouquet, V.; Perrin, A.; Gautier, B.
Language:English
Date of Publication (YYYY-MM-DD):2004
Title of Journal:Annalen der Physik
Volume:13
Issue / Number:1-2
Start Page:35
End Page:38
Review Status:not specified
Audience:Not Specified
Abstract / Description:SrBi2Nb2O9 (SBN) films were grown by pulsed laser deposition on (400)
and (110) Pt epitaxial bottom layers. In both cases x-ray diffraction
evidenced the epitaxial growth of SBN in spite of the coexistence of
mainly two orientations. SBN films on (100) Pt present usually a
dominant (001) orientation with the (115) one. AFM piezoresponse images
agree with the crystallographic data, i.e. only the (115) oriented
grains show a piezoelectric contrast. The SBN films grown on (I 10) Pt
lead to a more homogenous piezoresponse imaging, in agreement with the
preferential (116) orientation and the microstructure. (C) 2004
WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Free Keywords:thin films; SrBi2Nb2O9; piezoresponse; AFM
External Publication Status:published
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
External Affiliations:Univ Rennes 1, CNRS, UMR 6511, Lab Chim Solide & Inorgan Mol,Inst Chim Rennes, F-35042 Rennes, France.
; Inst Natl Sci Appl, CNRS, UMR 5511, Lab Phys Mat, F-69621 Villeurbanne, France.
Identifiers:ISI:000188828900007 [ID No:1]
ISSN:0003-3804 [ID No:2]
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