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          Institute: MPI für Festkörperforschung     Collection: FKF Publikationen 2003     Display Documents



  history
ID: 192734.0, MPI für Festkörperforschung / FKF Publikationen 2003
Study of the electronic and atomic structure of thermally treated SrTiO3 (110) surfaces
Authors:Gunhold, A.; Beuermann, L.; Gömann, K.; Borchardt, G.; Kempter, V.; Maus-Friedrichs, W.; Piskunov, S.; Kotomin, E. A.; Dorfman, S.
Language:English
Date of Publication (YYYY-MM-DD):2003
Title of Journal:Surface and Interface Analysis
Volume:35
Start Page:998
End Page:1003
Review Status:not specified
Audience:Not Specified
Abstract / Description:The electronic structure of heated SrTiO3(110) surfaces was
investigated with metastable impact electron spectroscopy and
ultraviolet photoelectron spectroscopy (He(l)). Scanning tunnelling
microscopy and atomic force microscopy (AFM) were used to study the
topology of the surface. The crystals were heated up to 1000degreesC
under reducing conditions in ultrahigh vacuum or under oxidizing
conditions in synthetic air for I h, respectively. Under both
conditions microfacetting of the surface is observed. The experimental
results are compared with ab initio Hartree-Fock calculations, also
presented here, carried out for both ideal and reconstructed
SrTiO3(110) surfaces. The results give direct evidence for Ti
termination of the faceted TiO2 rows. Copyright (C) 2003 John Wiley
Sons, Ltd.
Free Keywords:strontium titanate; metastable impact electron spectroscopy (MIES);
UPS; STM; AFM; ab initio calculations
External Publication Status:published
Document Type:Article
Communicated by:Michaela Asen-Palmer
Affiliations:MPI für Festkörperforschung
External Affiliations:Tech Univ Clausthal, Inst Phys & Phys Technol, D-38678 Clausthal Zellerfeld, Germany.
; Tech Univ Clausthal, Inst Met, D-38678 Clausthal Zellerfeld, Germany.
; Univ Osnabruck, Fachbereich Phys, D-49069 Osnabruck, Germany.
; Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia.
; Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany.
; Technion Israel Inst Technol, Dept Phys, IL-32000 Haifa, Israel.
Identifiers:ISI:000187718900009 [ID No:1]
ISSN:0142-2421 [ID No:2]
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