Please note that eDoc will be permanently shut down in the first quarter of 2021!      Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 194925.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Cross-sectional TEM study on metal/carbon nanotube interface
Authors:Jin-Phillipp, N.Y.; Kelsch, M.; Sycha, M.; Thomas, J.; Rühle, M.
Language:English
Publisher:Press Syndicate of the University of Cambridge
Place of Publication:New York, USA
Date of Publication (YYYY-MM-DD):2004-08
Title of Proceedings:Proceedings Microscopy and Microanalysis 2004, Suppl. 2
Start Page:280CD
End Page:281CD
Name of Conference/Meeting:Microscopy and Microanalysis 2004
Place of Conference/Meeting:Savannah, Georgia, USA
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2004-08-01
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2004-08-05
Copyright:2004 Microscopy Society of America
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Abt. Rühle
MPI für Metallforschung/Abt. Rühle/ZWE Hochspannungs-Mikroskopie
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.