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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Schütz (Modern Magnetic Systems)     Display Documents



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ID: 200769.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Schütz (Modern Magnetic Systems)
Existence of transient temperature spike induced by SHI: evidence by ion beam analysis
Authors:Avasthi, D. K.; Ghosh, S.; Srivastava, S. K.; Assmann, W.
Language:English
Date of Publication (YYYY-MM-DD):2004
Title of Journal:Nuclear Instruments and Methods in Physics Research B
Journal Abbrev.:NIM B
Volume (in Journal):219-220
Title of Issue:Proceedings of the Sixteenth International Conference on Ion Beam Analysis
Full Name of Issue-Editor(s):Vizkelethy, G.
Start Page:206
End Page:214
Name of Conference/Meeting:Sixteenth International Conference on Ion Beam Analysis
Place of Conference/Meeting:Albuquerque, NM [USA]
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2003-06-29
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2003-07-04
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Michael Hirscher
Affiliations:MPI für Metallforschung/Abt. Schütz
External Affiliations:Nuclear Science Centre, Aruna Asaf Ali Road, P.O. Box 10502, JNU campus, New Delhi 110 067, India;
Belonia College, Belonia, South Tripura 799 155, India;
Ludwig Maximilians University, München, 85748 Garching, Germany
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