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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)     Display Documents



  history
ID: 21075.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)
Dynamic observation of Al thin films plastically strained in a TEM
Authors:Legros, M.; Dehm, G.; Keller-Flaig, R.-M.; Arzt, E.; Hemker, K. J.; Suresh, S.
Language:English
Date of Publication (YYYY-MM-DD):2001-07-15
Title of Journal:Materials Science and Engineering A
Journal Abbrev.:Mater. Sci. Eng. A
Volume:309-310
Start Page:463
End Page:467
Review Status:Peer-review
Audience:Experts Only
Free Keywords:thin film; in situ; Al; cross-section; dislocations; interface
Comment of the Author/Creator:Date: 2001, JUL 15
External Publication Status:published
Document Type:Article
Affiliations:MPI für Metallforschung/Abt. Arzt
External Affiliations:Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA; Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA; Ecole Mines, CNRS, Phys Mat Lab, F-54042 Nancy, France; Univ Stuttgart, Univ Stuttgart, Inst Met Kunde, D-70174 Stuttgart, Germany; MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
Identifiers:ISI:000169044600092 [ID No:1]
ISSN:0921-5093 [ID No:2]
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