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          Institute: Fritz-Haber-Institut     Collection: Theory     Display Documents



ID: 2136.0, Fritz-Haber-Institut / Theory
Microscopic properties of thin films: Learning about point defects
Authors:Ourmazd, A.; Scheffler, M.; Heinemann, M.; Rouviere, J.-L.
Date of Publication (YYYY-MM-DD):1992
Title of Journal:MRS Bulletin
Volume:17
Start Page:24
End Page:31
Review Status:not specified
Audience:Not Specified
Document Type:Article
Communicated by:Matthias Scheffler
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