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Home Search Quick Search Advanced Fulltext Browse Collections Persons My eDoc Session History Login Name: Password: Documentation Help Support Wiki Direct access to document ID:	Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics)     Display Documents   history ID: 213940.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics) Microstructural changes in amorphous Si/crystalline Al thin bilayer films upon annealing Authors: Zhao, Y. H.; Wang, J. Y.; Mittemeijer, E. J. Language: English Date of Publication (YYYY-MM-DD): 2004-08 Title of Journal: Applied Phsics A Journal Abbrev.: Appl. Phys. A Volume: 79 Issue / Number: 3 Start Page: 681 End Page: 690 Review Status: Peer-review Audience: Experts Only External Publication Status: published Document Type: Article Communicated by: Ralf Schacherl Affiliations: MPI für Metallforschung/Abt. Mittemeijer Identifiers: ISI:000221675000046 [ID No:1] ISSN:0947-8396 [ID No:2] The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.