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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)     Display Documents



  history
ID: 21801.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)
X-ray scattering from misfit dislocations in heteroepitaxial films: The case of Nb(110) on Al2O3
Authors:Barabash, R. I.; Donner, W.; Dosch, H.
Language:English
Date of Publication (YYYY-MM-DD):2001-01-22
Title of Journal:Applied Physics Letters
Journal Abbrev.:Appl. Phys. Lett.
Volume:78
Issue / Number:4
Start Page:443
End Page:445
Review Status:Peer-review
Audience:Experts Only
Comment of the Author/Creator:Date: 2001, JAN 22
External Publication Status:published
Document Type:Article
Affiliations:MPI für Metallforschung/Abt. Dosch
External Affiliations:Univ Stuttgart, Inst Theoret & Angew Phys, D-70569 Stuttgart, Germany; Natl Tech Univ Ukraine, Kiev Polytech Inst, UA-252056 Kiev, Ukraine
Identifiers:ISI:000166477300018 [ID No:1]
ISSN:0003-6951 [ID No:2]
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