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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 21841.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Ge-Si nanostructures for quantum-effect electronic devices
Authors:Ernst, F.; Kienzle, O.; Schmidt, O. G.; Eberl, K.; Zhu, J.; Brunner, K.; Abstreiter, G.
Language:English
Publisher:IOP Publ. Ltd.
Place of Publication:Bristol
Date of Publication (YYYY-MM-DD):2001
Title of Proceedings:Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference
Start Page:167
End Page:176
Title of Series:Institute of Physics Conference Series
Volume (in Series):169
Corporate Body ed. Series:Institute of Physics
Name of Conference/Meeting:Microscopy of Semiconducting Materials 2001
Place of Conference/Meeting:Oxford, UK
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2001-03-25
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2001-03-29
Review Status:not specified
Audience:Experts Only
Comment of the Author/Creator:Date: 2001
External Publication Status:published
Document Type:Conference-Paper
Affiliations:MPI für Intelligente Systeme/Ehem. Abt. Rühle
External Affiliations:Case Western Reserve Univ, Dept Mat Sci & Engn, 10900 Euclid; Ave, Cleveland, OH 44106 USA; Carl Zeiss, Entwicklungslab Halbleitertech, D-73446 Oberkochen, Germany; Max Planck Inst Festkorperforsch, D-70659 Stuttgart, Germany; Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
Identifiers:ISI:000176465200035 [ID No:1]
ISSN:0951-3248 [ID No:2]
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