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          Institute: MPI für Mikrostrukturphysik     Collection: Publikationen des MPI-MSP     Display Documents



  history
ID: 223937.0, MPI für Mikrostrukturphysik / Publikationen des MPI-MSP
Effects on surface morphology of epitaxial Y2O3 layers on Si (001) after postgrowth annealing
Authors:Ioannou-Sougleridis, V.; Constantoudis, V.; Alexe, M.; Scholz, R.; Vellianitis, G.; Dimoulas, A.
Date of Publication (YYYY-MM-DD):2004
Title of Journal:Thin Solid Films
Volume:468
Issue / Number:1-2
Start Page:303
End Page:309
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Communicated by:N. N.
Affiliations:MPI für Mikrostrukturphysik
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