Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)     Display Documents



  history
ID: 240396.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Arzt (Micro/nanomechanics of Thin Films and Biological Systems)
Microscopic investigation of strain localization and fatigue damage in thin Cu films
Authors:Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Kraft, O.
Language:English
Date of Publication (YYYY-MM-DD):2005-09-14
Title of Journal:Materials Science Forum
Volume:475-479
Start Page:3647
End Page:3650
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Cornelia Schurr
Affiliations:MPI für Metallforschung/Abt. Arzt
External Affiliations:Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, P. R. China;
Institut für Materialforschung II, Forschungszentrum Karlsruhe, Postfach 3640, D-76021 Karlsruhe, Germany
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.