Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 24342.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Advances in energy-filtering transmission electron microscopy
Authors:Sigle, W.; Zern, A.; Hahn, K.; Eigenthaler, U.; Rühle, M.
Language:English
Date of Publication (YYYY-MM-DD):2001
Title of Journal:Journal of Electron Microscopy
Journal Abbrev.:J. Electron Microsc.
Volume:50
Issue / Number:6
Start Page:509
End Page:515
Review Status:Peer-review
Audience:Experts Only
Free Keywords:27-ru_2002; energy-filtering transmission electron microscopy (EFTEM); bond mapping; amorphous materials; reduced density function; aberration correction; electron diffraction.
Comment of the Author/Creator:Date: 2001
External Publication Status:published
Document Type:Article
Affiliations:MPI für Metallforschung/Abt. Rühle
Identifiers:ISI:000173995200013 [ID No:1]
ISSN:0022-0744 [ID No:2]
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.