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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Ehemalige Abt. Rühle (Microstructure and Interfaces)     Display Documents



  history
ID: 256286.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Ehemalige Abt. Rühle (Microstructure and Interfaces)
Defect morphology and strain of CVD grown 3C-SiC layers: effect of the carbonization process
Authors:Mendez, D.; Aouni, A.; Morales, F. M.; Pacheco, F. J.; Araujo, D.; Bustarret, E.; Ferro, G.; Monteil, Y.
Language:English
Date of Publication (YYYY-MM-DD):2005-03
Title of Journal:Physica Status Solidi A
Journal Abbrev.:Phys. Status Solidi A-Appl. Mat.
Volume:202
Issue / Number:4
Start Page:561
End Page:565
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Ehemalige Abt. Rühle
External Affiliations:Univ Cadiz, Dept Ciencia Mat e IM y QI, Puerto Real 11510, Spain.; Fac Sci & Tech, Tanger, Morocco.; CNRS, LEPES, F-38042 Grenoble, France.; UCB Lyon 1, LMI, F-69622 Villeurbanne, France.
Identifiers:ISI:000228522300016 [ID No:1]
ISSN:0031-8965 [ID No:2]
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