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          Institute: Fritz-Haber-Institut     Collection: Chemical Physics     Display Documents



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ID: 277300.0, Fritz-Haber-Institut / Chemical Physics
Frequency-modulated atomic force spectroscopy on NiAl(110) partially covered with a thin alumina film
Authors:Heyde, Markus; Kulawik, Maria; Rust, Hans-Peter; Freund, Hans-Joachim
Language:English
Date of Publication (YYYY-MM-DD):2006-03-15
Title of Journal:Physical Review B
Journal Abbrev.:Phys. Rev. B
Volume:73
Issue / Number:12
Start Page:125320–1
End Page:125320–6
Copyright:© 2006 The American Physical Society
Review Status:Peer-review
Audience:Experts Only
Abstract / Description:Force spectroscopy has been performed using a low-temperature scanning tunneling microscope (STM) and atomic force microscope (AFM) with small amplitude frequency modulation (FM). Frequency shift versus distance curves acquired on NiAl(110) are compared to measurements performed on a thin alumina film. Interaction force and energy are determined from the frequency shift. Due to the high stability of small amplitude frequency modulation in combination with a stiff force sensor, it is possible to observe clear differences in the interaction potential between the metal and oxide surface. The setup also allows us to gain specific information in the repulsive regime of the contact formation, where elastic and plastic stages have been identified.
Free Keywords:Nickel alloys; aluminium alloys; alumina; atomic force microscopy; thin films; scanning tunnelling microscopy; Scanning-tunneling-microscopy; Quartz tuning fork; Oxide surfaces; Ultrahigh-vacuum; Low-temperatures; Defined tip; Resolution; Adhesion; Sample; Sensor
External Publication Status:published
Document Type:Article
Communicated by:Hans-Joachim Freund
Affiliations:Fritz-Haber-Institut/Chemical Physics/Atomic Force Microscopy
Fritz-Haber-Institut/Chemical Physics/Chemical Physics
Identifiers:URL:http://link.aps.org/abstract/PRB/v73/e125320
DOI:10.1103/PhysRevB.73.125320
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