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          Institute: MPI für Informatik     Collection: Computer Graphics Group     Display Documents



ID: 278956.0, MPI für Informatik / Computer Graphics Group
Fast and Robust Detection of Crest Lines on Meshes
Authors:Yoshizawa, Shin; Belyaev, Alexander; Seidel, Hans-Peter
Editors:Kobbelt, Leif; Shapiro, Vadim
Language:English
Publisher:ACM
Place of Publication:New York, USA
Date of Publication (YYYY-MM-DD):2005
Title of Proceedings:Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005
Start Page:227
End Page:232
Place of Conference/Meeting:Cambridge, Massachusetts, USA
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2005-06-13
Audience:Experts Only
Intended Educational Use:No
Abstract / Description:We propose a fast and robust method for detecting
crest lines on surfaces approximated by dense triangle meshes.
The crest lines, salient surface features defined via first- and
second-order curvature derivatives, are widely used for shape
matching and interrogation purposes. Their practical extraction
is difficult because it requires good estimation of high-order
surface derivatives. Our approach to the crest line detection
is based on estimating the curvature tensor and curvature
derivatives via local polynomial fitting.
Since the crest lines are not defined in the surface regions
where the surface focal set (caustic) degenerates, we introduce
a new thresholding scheme which exploits interesting relationships
between curvature extrema, the so-called MVS functional of Moreton
and Sequin, and Dupin cyclides,
An application of the crest lines to adaptive mesh simplification
is also considered.
Last Change of the Resource (YYYY-MM-DD):2006-04-25
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Hans-Peter Seidel
Affiliations:MPI für Informatik/Computer Graphics Group
Identifiers:LOCALID:C125675300671F7B-B689675F69641AFCC1256FC000660260-...
ISBN:1-59593-015-9
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