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          Institute: Fritz-Haber-Institut     Collection: Chemical Physics     Display Documents



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ID: 281442.0, Fritz-Haber-Institut / Chemical Physics
Influence of substrate morphology on organic layer growth: PTCDA on Ag(111)
Authors:Marchetto, Helder; Groh, Ullrich; Schmidt, Thomas; Fink, Rainer; Freund, Hans-Joachim; Umbach, Eberhard
Language:English
Date of Publication (YYYY-MM-DD):2006-06-09
Title of Journal:Chemical Physics
Journal Abbrev.:Chem. Phys.
Volume:325
Issue / Number:1
Start Page:178
End Page:184
Copyright:© 2006 Elsevier B.V. All rights reserved.
Review Status:Peer-review
Audience:Experts Only
Abstract / Description:By UV-excited photoelectron emission microscopy (UV-PEEM) we investigated the microscopic growth behavior of organic thin films using 3,4,9,10-perylene-tetracarboxylicacid dianhydride (PTCDA) on a Ag(1 1 1) single crystal substrate as example. Direct, real time observation allows to correlate the initial growth modes and the related kinetic parameters with substrate properties like terrace width, step density, and step bunches from the submonolayer range up to 5 layers or more. Above room temperature PTCDA grows in a Stranski–Krastanov fashion: after completion of the first two stable layers three-dimensional islands are formed. The nucleation density strongly depends on the temperature and the substrate morphology thus affecting the properties of the organic film.
Free Keywords:Photoelectron emission microscopy; OMBE; Growth kinetics; Nucleation
External Publication Status:published
Document Type:Article
Communicated by:Hans-Joachim Freund
Affiliations:Fritz-Haber-Institut/Chemical Physics/Spectroscopy / Spectro-Microscopy
Fritz-Haber-Institut/Chemical Physics/Chemical Physics
External Affiliations:Groh U, Schmidt T., Fink R, Umbach E, Experimentelle Physik II, Universität Würzburg, Am Hubland, D-97074 Würzburg, Germany;
 Fink R, Physikalische Chemie II, Universität Erlangen-Nürnberg, Egerlandstraße 3, D-91058 Erlangen, Germany
Identifiers:URL:http://www.sciencedirect.com/science?_ob=ArticleUR...
DOI:10.1016/j.chemphys.2006.01.006
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