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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 282009.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction
Authors:Koch, C. T.; Bhattacharyya, S.; Rühle, M.; Satet, R.; Hoffmann, M. J.
Language:English
Date of Publication (YYYY-MM-DD):2006
Title of Journal:Microscopy and Microanalysis
Volume:12
Start Page:160
End Page:169
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
MPI für Metallforschung/Emeriti and Others
External Affiliations:Institut für Keramik im Maschinenbau, Universität
Karlsruhe (TH), D-76131 Karlsruhe, Germany
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