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Home Search Quick Search Advanced Fulltext Browse Collections Persons My eDoc Session History Login Name: Password: Documentation Help Support Wiki Direct access to document ID:	Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics)     Display Documents ID: 285120.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics) X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer. Authors: Zhao, Y. H.; Welzel, U.; van Lier, J.; Mittemeijer, E. J. Language: English Date of Publication (YYYY-MM-DD): 2006 Title of Journal: Thin Solid Films Volume: 514 Start Page: 110 End Page: 119 Review Status: Peer-review Audience: Experts Only External Publication Status: published Document Type: Article Communicated by: Ralf Schacherl Affiliations: MPI für Metallforschung/Abt. Mittemeijer Full Text: Sorry, no privileges The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.