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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 287718.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Requisites for ultimate energy resolution EELS and band gap measurements in TEM
Authors:Essers, E.; Höschen, R.; Matijevic, M.; Benner, G.; Koch, C. T.
Language:English
Publisher:International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD):2006
Title of Proceedings:Proceedings of the 16th International Microscopy Congress 2006
Start Page:810
End Page:810
Name of Conference/Meeting:16th International Microscopy Congress - IMC16
Place of Conference/Meeting:Sapporo, Japan
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2006-09-03
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2006-09-08
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Carl Zeiss GmbH, Carl-Zeiss-Str. 56, 73447 Oberkochen, Germany
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