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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)     Display Documents



  history
ID: 288174.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Dosch/Rühle (Metastable and Low-dimensional Materials)
SNOM characterization of self-assembled organic nanocrystals
Authors:Lacharmoise, P. D.; Ossó, J. O.; Goni, A. R.; Alonso, M. I.; Barrena, E.; de Oteyza, D. G.; Dosch, H.
Language:English
Place of Publication:Melville, NY
Date of Publication (YYYY-MM-DD):2006-08-08
Title of Proceedings:Physics of Semiconductors, 28th International Conference
Start Page:377
End Page:378
Title of Series:AIP Conference Proceedings
Volume (in Series):893
Name of Conference/Meeting:28th International Conference on Physics of Semiconductors
Place of Conference/Meeting:Vienna, Austria
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2006-07-24
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2006-07-28
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Peter Wochner
Affiliations:MPI für Metallforschung/Abt. Dosch
External Affiliations:Institut de Ciència de Materials de Barcelona-CSIC, Esfera UAB, 08193 Bellaterra, Spain;
MATGAS 2000 A.I.E. Barcelona, Campus UAB, 08193 Bellaterra, Spain
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