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          Institute: MPI für Kolloid- und Grenzflächenforschung     Collection: Grenzflächen     Display Documents



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ID: 289894.0, MPI für Kolloid- und Grenzflächenforschung / Grenzflächen
Sensitivity analysis of ellipsometry applied to uniaxial optical films.
Authors:Flueraru, C.; Schrader, S.; Zauls, V.; Motschmann, H.; Stiller, B.; Kiebooms, R.
Date of Publication (YYYY-MM-DD):2000
Title of Journal:Thin Solid Films
Volume:379
Start Page:15
End Page:22
Copyright:Jahrbuch 2001, Copyright MPG 2001
Review Status:not specified
Audience:Not Specified
Intended Educational Use:No
Document Type:Article
Affiliations:MPI für Kolloid- und Grenzflächenforschung/Grenzflächen
Identifiers:LOCALID:28705
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