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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents



  history
ID: 293509.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others
Electron-loss near-edge structure analysis of precipitates in Yttria-doped alumina
Authors:Sturm, S.; Gülgün, M.; Cannon, R. M.; Rühle, M.
Language:English
Publisher:International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD):2006
Title of Proceedings:Proceedings of the 16th International Microscopy Congress 2006
Start Page:1414
End Page:1414
Name of Conference/Meeting:16th International Microscopy Congress - IMC16
Place of Conference/Meeting:Sapporo, Japan
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2006-09-03
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2006-09-08
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Heide Klooz
Affiliations:MPI für Metallforschung/Emeriti and Others
MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Josef Stefan Institute, Jamova 39, SI-100 Ljubljana, Slovenia;
Savanci Unaiversity, FENS, Orhanli, Tuzla, Istanbul 34956, Turkey;
MSD, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
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