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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents



ID: 297855.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others
SESAM: Exploring the frontiers of electron microscopy
Authors:Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.
Language:English
Date of Publication (YYYY-MM-DD):2006-12
Title of Journal:Microscopy and Microanalysis
Journal Abbrev.:Microsc. Microanal.
Volume:12
Issue / Number:6
Start Page:506
End Page:514
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Heide Klooz
Affiliations:MPI für Metallforschung/Zentrum für Transmissionslektronenmikroskopie
MPI für Metallforschung/Emeriti and Others
External Affiliations:Carl Zeiss SMT NTS Div, D-73447 Oberkochen, Germany.
Identifiers:ISI:000242478200010 [ID No:1]
ISSN:1431-9276 [ID No:2]
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