MPI für Festkörperforschung / FKF Publikationen 2006 |
|Transport and TEM on dysprosium metallofullerene peapods|
|Authors:||Obergfell, D.; Meyer, J. C.; Haluska, M.; Khlobystov, A. N.; Yang, S.; Fan, L.; Liu, D.; Roth, S.|
|Date of Publication (YYYY-MM-DD):||2006|
|Title of Journal:||physica status solidi (b)|
|Issue / Number:||13|
|Abstract / Description:||Single-walled carbon nanotubes (SWNTs) produced by the arc-discharge
method using non-magnetic catalysts were filled with Dy@C-82 endohedral
metallofullerenes. Transport measurements were performed on
(DY@C-82)@SWNT metallofullerene peapod samples in field-effect
transistor configuration at 4.2 K. After the transport investigations
the substrates were partially etched away enabling us to take TEM
images of the very same metallofullerene peapod samples on which
transport had been carried out before. This procedure gives essential
information on whether the sample measured was a single tube or a
bundle and on the degree of tube filling. In the case of the presented
measurements, TEM investigations revealed one sample to be a
metallofullerene peapod bundle and another one to be an individual tube
being not or not completely filled despite of a high overall sample
filling. Both samples behave as semiconductors, where the latter sample
exhibits Coulomb blockade oscillations for low bias voltages. Thus we
present the first combined Coulomb blockade diamond and TEM
measurements on a single nanotube and moreover the first transport data
including the transfer characteristics I-sd(V-g) of a sample which is
confirmed to be a metallofullerene peapod bundle. (c) 2006 WILEY-VCH
Verlag GmbH & Co. KGaA, Weinheim.
|External Publication Status:||published|
|Communicated by:||N. N.|
|Affiliations:||MPI für Festkörperforschung|
|External Affiliations:||Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany.
; Univ Nottingham, Sch Chem B28, Nottingham NG7 2RD, England.
; Hong Kong Univ Sci & Technol, Dept Chem, Kowloon, Hong Kong, Peoples R China.
|Identifiers:||ISI:000242187000098 [ID No:1] |
ISSN:0370-1972 [ID No:2]
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