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          Institute: MPI für Mikrostrukturphysik     Collection: Publikationen des MPI-MSP     Display Documents



ID: 312948.0, MPI für Mikrostrukturphysik / Publikationen des MPI-MSP
Measurement of the bending strength of vapor-liquid-solid grown silicon
nanowires
Authors:Hoffmann, S.; Utke, I.; Moser, B.; Michler, J.; Christiansen, S. H.; Schmidt, V.; Senz, S.; Werner, P.; Gösele, U.; Ballif, C.
Date of Publication (YYYY-MM-DD):2006
Title of Journal:Nano Letters
Volume:6
Issue / Number:4
Start Page:622
End Page:625
Review Status:Peer-review
Audience:Experts Only
Intended Educational Use:No
External Publication Status:published
Document Type:Article
Communicated by:N. N.
Affiliations:MPI für Mikrostrukturphysik
Identifiers:LOCALID:P6608
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