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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 319189.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM
Authors:van Aken, P. A.; Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.
Language:English
Publisher:Cambridge University Press
Place of Publication:New York, USA
Date of Publication (YYYY-MM-DD):2007
Title of Proceedings:Microscopy and Microanalysis 2007
Start Page:862CD
End Page:863CD
Name of Conference/Meeting:Microscopy and Microanalysis 2007
Place of Conference/Meeting:Fort Lauderdale, Florida, USA
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2007-08-05
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2007-08-09
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
MPI für Metallforschung/Emeriti and Others
External Affiliations:Carl Zeiss SMT-NTS Division, Oberkochen, Germany
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