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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 319197.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Nanostructure characterization of iron catalyst assisted SiC nanowires
Authors:Liu, Z.; Srot, V.; van Aken, P. A.; Yang, J. C.; Rühle, M.
Language:English
Publisher:Cambridge University Press
Place of Publication:New York, USA
Date of Publication (YYYY-MM-DD):2007
Title of Proceedings:Microscopy and Microanalysis 2007
Start Page:754CD
End Page:755CD
Name of Conference/Meeting:Microscopy and Microanalysis 2007
Place of Conference/Meeting:Fort Lauderdale, Florida, USA
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2007-08-05
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2007-08-09
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
MPI für Metallforschung/Emeriti and Others
External Affiliations:Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA,USA
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