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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics)     Display Documents



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ID: 319234.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Abt. Mittemeijer (Phase Transformations, Thermodynamics, and Kinetics)
The microstructure and state of stress of Sn thin films after post-plating annealing; an explanation for the suppression of whisker formation?
Authors:Sobiech, M.; Welzel, U.; Schuster, R.; Mittemeijer, E. J.; Hügel, W.; Seekamp, A.; Müller, V.
Language:English
Publisher:IEEE Service Center
Place of Publication:Piscataway, NJ
Date of Publication (YYYY-MM-DD):2007
Title of Proceedings:2007 IEEE Electronic Components & Technology Conference, ECTC '07. Proceedings
Start Page:192
End Page:197
Name of Conference/Meeting:57th IEEE Electronic Components and Technology Conference
Place of Conference/Meeting:Reno, Nevada [USA]
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2007-05-29
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2007-06-01
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Ralf Schacherl
Affiliations:MPI für Metallforschung/Abt. Mittemeijer
Identifiers:ISBN:1-4244-0985-3
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