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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 320100.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Comparison of chemical composition of PMN-PT thin foils prepared by ion-milling and wedge preparation technique
Authors:Gec, M.; Srot, V.; Jeon, J. H.; van Aken, P. A.; Ceh, M.
Language:English
Publisher:The Czechoslovak Microscopy Society
Place of Publication:České Budějovice
Date of Publication (YYYY-MM-DD):2007
Title of Proceedings:Proceedings of the 8th Multinational Congress on Microscopy
Start Page:251
End Page:252
Name of Conference/Meeting:8th Multinational Congress on Microscopy
Place of Conference/Meeting:Prague
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2007-06-17
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2007-06-21
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Nanostructured Materials, Jožef Stefan Institute, Ljubljana, Slovenia
Korea Institute of Machinery and Materials, Changwon, South Korea
Identifiers:ISBN:978-80-239-9397-4
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