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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 320730.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Analytical performance of the SESAM microscope
Authors:Essers, E.; Matijevic, M.; Benner, G.; Höschen, R.; Sigle, W.; Koch, C.
Language:English
Date of Publication (YYYY-MM-DD):2007
Title of Journal:Microscopy & Microanalysis
Volume (in Journal):13
Issue / Number:Suppl. 3
Start Page:18
End Page:19
Name of Conference/Meeting:33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.)
Place of Conference/Meeting:Saarbrücken
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2007-09-02
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2007-09-07
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Carl Zeiss NTS GmbH, Oberkochen, Germany
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