Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Eisenforschung GmbH     Collection: Materials Technology     Display Documents



  history
ID: 337581.0, MPI für Eisenforschung GmbH / Materials Technology
Characterization of the microstructure of Al-rich TiAl alloys by combined TEM imaging techniques
Authors:Kelm, K.; Irsen, S.; Paninski, M.; Drevermann, A.; Schmitz, G. J.; Palm, M.; Stein, F.; Heilmaier, M.; Engberding, N.; Saage, H.; Sturm, D.
Language:English
Date of Publication (YYYY-MM-DD):2007
Title of Journal:Microscopy and Microanalysis
Journal Abbrev.:Microsc. Microanal.
Volume:13
Issue / Number:3
Start Page:294
End Page:295
Review Status:Peer-review
Audience:Not Specified
External Publication Status:published
Document Type:Article
Affiliations:MPI für Eisenforschung GmbH
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.