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          Institute: MPI für Mikrostrukturphysik     Collection: Publikationen des MPI-MSP     Display Documents



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ID: 350320.0, MPI für Mikrostrukturphysik / Publikationen des MPI-MSP
Fabrication, characterization and modeling of strained SOI MOSFETs with very large effective mobility.
Authors:Driussi, F.; Esseni, D.; Selmi, L.; Schmidt, M.; Lemme, M. C.; Kurz, H.; Buca, D.; Mantl, S.; Luysberg, M.; Loo, R.; Nguyen, D.; Reiche, M.
Date of Publication (YYYY-MM-DD):2007
Title of Proceedings:Proceedings of the 37th European Solid-State Device Reseach Conference (ESSDERC 2007)
Start Page:315
End Page:318
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Conference-Paper
Communicated by:N. N.
Affiliations:MPI für Mikrostrukturphysik
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