Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Institute: MPI für Mikrostrukturphysik     Collection: Publikationen des MPI-MSP     Display Documents



  history
ID: 352130.0, MPI für Mikrostrukturphysik / Publikationen des MPI-MSP
Extrinsic contributions to the apparent thickness dependence of the dielectric constant in epitaxial Pb(Zr,Ti)O3 thin films
Authors:Pintilie, L.; Vrejoiu, I.; Hesse, D.; LeRhun, G.; Alexe, M.
Date of Publication (YYYY-MM-DD):2007
Title of Journal:Physical Review B
Volume:75
Issue / Number:22
Sequence Number of Article:224113
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Communicated by:N. N.
Affiliations:MPI für Mikrostrukturphysik
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.