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          Institute: MPI für Informatik     Collection: Computer Graphics Group     Display Documents



ID: 356536.0, MPI für Informatik / Computer Graphics Group
Adaptive sampling of reflectance fields
Authors:Fuchs, Martin; Blanz, Volker; Lensch, Hendrik P. A.; Seidel, Hans-Peter
Language:English
Date of Publication (YYYY-MM-DD):2007
Title of Journal:ACM Transactions on Graphics
Volume:26
Issue / Number:2
Start Page:10.1
End Page:18
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(c) 2007 ACM 0730-0301/2007/06-ART10 $5.00 DOI 10.1145/1243980.1243984
http://doi.acm.org/10.1145/1243980.1243984
Review Status:Peer-review
Audience:Experts Only
Intended Educational Use:No
Abstract / Description:Image-based relighting achieves high quality in rendering, but it requires a
large number of measurements of the reflectance field. This article discusses
sampling techniques that improve on the trade-offs between measurement effort
and reconstruction quality.

Specifically, we (i) demonstrate that sampling with point lights and from a
sparse set of incoming light directions creates artifacts which can be reduced
significantly by employing extended light sources for sampling, (ii) propose a
sampling algorithm which incrementally chooses light directions adapted to the
properties of the reflectance field being measured, thus capturing significant
features faster than fixed-pattern sampling, and (iii) combine reflectance
fields
from two different light domain resolutions.

We present an automated measurement setup for well-defined angular
distributions of the incident, indirect illumination. It is based on
programmable spotlights with controlled aperture that illuminate the walls
around the scene.
Last Change of the Resource (YYYY-MM-DD):2008-03-13
External Publication Status:published
Document Type:Article
Communicated by:Hans-Peter Seidel
Affiliations:MPI für Informatik/Computer Graphics Group
Identifiers:LOCALID:C12573CC004A8E26-137EDB39E9A2266BC1257364004C99E6-...
DOI:10.1145/1243980.1243984
ISSN:0730-0301
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