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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 362409.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
Authors:Haider, M.; Müller, H.; Uhlemann, S.; J. Zach, J.; Löbau, U.; Höschen, R.
Language:English
Date of Publication (YYYY-MM-DD):2008
Title of Journal:Ultramicroscopy
Volume:108
Start Page:167
End Page:178
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
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