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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 372672.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Application of monochromated electrons in EELS
Authors:Sigle, W.; Gu, L.; Koch, C.; Srot, V.; Nelayah, J.; van Aken, P. A.
Language:English
Date of Publication (YYYY-MM-DD):2008
Title of Journal:Microscopy and Microanalysis
Volume (in Journal):14
Issue / Number:Supplement S2
Start Page:134
End Page:135
Name of Conference/Meeting:Microscopy and Microanalysis 2008. Microscopy Society of America, 66th Annual Meeting. Microbeam Analysis Society, 42nd Annual Meeting. International Metallographic Society, 41st Annual Meeting
Place of Conference/Meeting:Albuquerque, New Mexico, USA
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2008-08-03
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2008-08-07
Review Status:not specified
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
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