ID:
372672.0,
MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM |
Application of monochromated electrons in EELS |
Authors: | Sigle, W.; Gu, L.; Koch, C.; Srot, V.; Nelayah, J.; van Aken, P. A. |
Language: | English |
Date of Publication (YYYY-MM-DD): | 2008 |
Title of Journal: | Microscopy and Microanalysis |
Volume (in Journal): | 14 |
Issue / Number: | Supplement S2 |
Start Page: | 134 |
End Page: | 135 |
Name of Conference/Meeting: | Microscopy and Microanalysis 2008. Microscopy Society of America, 66th Annual Meeting. Microbeam Analysis Society, 42nd Annual Meeting. International Metallographic Society, 41st Annual Meeting |
Place of Conference/Meeting: | Albuquerque, New Mexico, USA |
(Start) Date of Conference/Meeting (YYYY-MM-DD): | 2008-08-03 |
End Date of Conference/Meeting (YYYY-MM-DD): | 2008-08-07 |
Review Status: | not specified |
Audience: | Experts Only |
External Publication Status: | published |
Document Type: | Conference-Paper |
Communicated by: | Fritz Phillipp |
Affiliations: | MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
|
|