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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 376669.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Amorphisation in fresnoite compounds – a combined ELNES and XANES study
Authors:Höche, T.; Heyroth, F.; van Aken, P. A.; Schrempel, F.; Henderson, G. S.; Blyth, R. I. R.
Language:English
Publisher:Springer
Place of Publication:Berlin [et al.]
Date of Publication (YYYY-MM-DD):2008
Title of Proceedings:EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Start Page:821
End Page:822
Name of Conference/Meeting:14th European Microscopy Congress
Place of Conference/Meeting:Aachen, Germany
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2008-09-01
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2008-09-05
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
External Affiliations:Leibniz-Institut für Oberflächenmodifizierung e.V., D-04103 Leipzig, Germany;
Martin-Luther-Universität Halle-Wittenberg, IZ für Materialwissenschaften, Heinrich-Damerow-Str. 4, D-06120 Halle, Germany;
Friedrich-Schiller-Universität Jena, Institut für Festkörperphysik, Max-Wien-Platz 1, D-07743 Jena, Germany;
Department of Geology, University of Toronto, 22 Russell Street, Toronto, M5S 3B1, Canada;
Canadian Light Source, 101 Perimeter Road, University of Saskatchewan, Saskatoon S7N OX4, Canada
Identifiers:DOI:10.10007/978-3-540-85226-1_411
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