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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Emeriti and Others     Display Documents



  history
ID: 394447.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Emeriti and Others
Analytical TEM investigations of Pt/YSZ interfaces
Authors:Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.
Language:English
Publisher:Springer
Place of Publication:Berlin [et al.]
Date of Publication (YYYY-MM-DD):2008
Title of Proceedings:EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Start Page:369
End Page:370
Name of Conference/Meeting:14th European Microscopy Congress
Place of Conference/Meeting:Aachen, Germany
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2008-09-01
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2008-09-05
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Heide Klooz
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
MPI für Intelligente Systeme/Emeriti and Others
External Affiliations:National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA94720, USA;
Department Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Straße 18, Leoben, Austria;
Institute of Physical Chemistry, Justus-Liebig-University Gießen, Heinrich-Buff-Ring 58, Gießen, Germany
Identifiers:DOI:10.1007/978-3-540-85226-1_185
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