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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 432258.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
Annealing effect on ion conduction of nanosized CaF2/BaF2 multilayers
Authors:Guo, X. X.; Matei, I.; Jin-Phillipp, N. Y.; van Aken, P. A.; Maier, J.
Language:English
Date of Publication (YYYY-MM-DD):2009
Title of Journal:Journal of Applied Physics
Volume:105
Sequence Number of Article:114321
Review Status:Peer-review
Audience:Experts Only
External Publication Status:published
Document Type:Article
Communicated by:Fritz Phillipp
Affiliations:MPI für Metallforschung/Stuttgart Center for Electron Microscopy (StEM)
MPI für Festkörperforschung/Maier
External Affiliations:Key Laboratory of Transparent and Opto-functional Inorganic Materials, Shanghai Institute of Ceramics,
Chinese Academy of Sciences, 1295 Ding Xi Road, Shanghai 200050, China.
Identifiers:DOI:10.1063/1.3143623
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