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          Institute: MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung)     Collection: Stuttgart Center for Electron Microscopy: StEM     Display Documents



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ID: 435823.0, MPI für Intelligente Systeme (ehemals Max-Planck-Institut für Metallforschung) / Stuttgart Center for Electron Microscopy: StEM
EFTEM tomography on nanomaterials
Authors:Jin-Phillipp, N. Y.; Koch, C. T.; van Aken, P. A.
Language:English
Publisher:Verlag der Technischen Universität Graz, Austria
Place of Publication:Graz
Date of Publication (YYYY-MM-DD):2009
Title of Proceedings:MC2009. Vol. 1: Instrumentation and Methodology
Start Page:73
End Page:74
Name of Conference/Meeting:MC2009, Microscopy Conference
Place of Conference/Meeting:Graz, Austria
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2009-08-30
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2009-09-04
Review Status:Internal review
Audience:Experts Only
External Publication Status:published
Document Type:Conference-Paper
Communicated by:Fritz Phillipp
Affiliations:MPI für Intelligente Systeme/Stuttgart Center for Electron Microscopy (StEM)
Identifiers:DOI:10.3217/978-3-85125-062-6-035
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